Assignee
KAMIENIECKI EMIL
US·8 granted patents·1 pending application·62 citations·filing 1985–2018
Top patents by PatentIndex Score
9 records- 0192US4663526ANondestructive readout of a latent electrostatic image formed on an insulating materialKAMIENIECKI EMIL·Filed 1985·Granted May 5, 1987·34 cites·42 claims
- 0288US8232817B2Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductorKAMIENIECKI EMIL·Filed 2010·Granted Jul 31, 2012·6 cites·17 claims
- 0388US7898280B2Electrical characterization of semiconductor materialsKAMIENIECKI EMIL·Filed 2008·Granted Mar 1, 2011·13 cites·12 claims
- 0483US10018738B2Inductive radiation detectorKAMIENIECKI EMIL·Filed 2017·Granted Jul 10, 2018·2 cites·20 claims
- 0581US10429522B1Electrostatic hole trapping radiation detectorsKAMIENIECKI EMIL·Filed 2018·Granted Oct 1, 2019·2 cites·14 claims
- 0681US8896338B2Electrical characterization of semiconductor materialsKAMIENIECKI EMIL·Filed 2012·Granted Nov 25, 2014·5 cites·16 claims
- 0762US10338237B2Inductive radiation detectorKAMIENIECKI EMIL·Filed 2018·Granted Jul 2, 2019·0 cites·11 claims
- 0853US9110127B2Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductorKAMIENIECKI EMIL·Filed 2012·Granted Aug 18, 2015·0 cites·15 claims
- 0939US2011301892A1System and method for characterizing the electrical properties of a semiconductor sampleKAMIENIECKI EMIL·Filed 2011·Application pending·0 cites
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