Assignee
KANEGAE KENSHI
JP·3 granted patents·1 pending application·5 citations·filing 2006–2012
Top patents by PatentIndex Score
4 records- 0166US8084826B2Semiconductor device and manufacturing method thereofKANEGAE KENSHI·Filed 2009·Granted Dec 27, 2011·4 cites·20 claims
- 0257US8994125B2Semiconductor device including a field effect transistorKANEGAE KENSHI·Filed 2012·Granted Mar 31, 2015·1 cites·24 claims
- 0350US8242567B2Semiconductor device and manufacturing method thereofKANEGAE KENSHI·Filed 2011·Granted Aug 14, 2012·0 cites·8 claims
- 0437US2006222235A1Defect inspection methodKANEGAE KENSHI·Filed 2006·Application pending·0 cites
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