Assignee
KANEV STOJAN
DE·3 granted patents·13 citations·filing 2007–2011
Technology mixG01R3
Top patents by PatentIndex Score
3 records- 0172US8278951B2Probe station for testing semiconductor substrates and comprising EMI shieldingKANEV STOJAN·Filed 2007·Granted Oct 2, 2012·8 cites·12 claims
- 0270US9194885B2Modular prober and method for operating sameKANEV STOJAN·Filed 2011·Granted Nov 24, 2015·3 cites·11 claims
- 0351US8368413B2Method for testing electronic components of a repetitive pattern under defined thermal conditionsKANEV STOJAN·Filed 2009·Granted Feb 5, 2013·2 cites·12 claims
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