Assignee
KAPUR ROHIT
US·3 granted patents·33 citations·filing 2008–2010
Top patents by PatentIndex Score
3 records- 0187US8065651B2Implementing hierarchical design-for-test logic for modular circuit designKAPUR ROHIT·Filed 2009·Granted Nov 22, 2011·24 cites·21 claims
- 0270US8584073B2Test design optimizer for configurable scan architecturesKAPUR ROHIT·Filed 2008·Granted Nov 12, 2013·7 cites·41 claims
- 0355US8660818B2Systemic diagnostics for increasing wafer yieldKAPUR ROHIT·Filed 2010·Granted Feb 25, 2014·2 cites·14 claims
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