Assignee
KEIL MICHAEL
DE·10 granted patents·3 pending applications·10 citations·filing 2009–2019
Top patents by PatentIndex Score
13 records- 0177US10317308B2Test disc systemKEIL MICHAEL·Filed 2015·Granted Jun 11, 2019·2 cites·13 claims
- 0270US8637707B2Method for producing aminobiphenyleneKEIL MICHAEL·Filed 2009·Granted Jan 28, 2014·2 cites·26 claims
- 0367US8061004B2Method of manufacturing a test stripKEIL MICHAEL·Filed 2009·Granted Nov 22, 2011·4 cites·7 claims
- 0462US10317310B2Testing system and method for testing the seal of a glove which is installed in the port of an isolatorKEIL MICHAEL·Filed 2018·Granted Jun 11, 2019·0 cites·16 claims
- 0562US9486021B2GloveKEIL MICHAEL·Filed 2011·Granted Nov 8, 2016·2 cites·17 claims
- 0661US10690566B2Test disc systemKEIL MICHAEL·Filed 2019·Granted Jun 23, 2020·0 cites·15 claims
- 0758US10317309B2Test disc, test system and method for testing the seal of a glove which is installed in a port of an isolator, a glove and an isolator for use with the test systemKEIL MICHAEL·Filed 2017·Granted Jun 11, 2019·0 cites·10 claims
- 0854US2019011326A1Testing system and method for testing the seal of a glove which is installed in the port of an insulatorKEIL MICHAEL·Filed 2018·Application pending·0 cites
- 0953US2012173534A1Automated determination and/or processing of informationKEIL MICHAEL·Filed 2012·Application pending·0 cites
- 1053US2015192492A1Test disc, test system and method for testing the seal of a glove which is installed in a port of an isolator, a glove and an isolator for use with the test systemKEIL MICHAEL·Filed 2015·Application pending·0 cites
- 1148US9475044B2Test strip with a shaped tip for skin straighteningKEIL MICHAEL·Filed 2011·Granted Oct 25, 2016·0 cites·12 claims
- 1244US9066689B2Lancet wheel and method for producing a lancet wheelKEIL MICHAEL·Filed 2010·Granted Jun 30, 2015·0 cites·16 claims
- 1341US9079862B2Process for preparing acetanilidesKEIL MICHAEL·Filed 2012·Granted Jul 14, 2015·0 cites·15 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →