Assignee
KIM BO YEUN
KR·3 granted patents·4 citations·filing 2008–2012
Technology mixG11C3
Top patents by PatentIndex Score
3 records- 0167US8824227B2Parallel test circuit and method of semiconductor memory apparatusKIM BO YEUN·Filed 2012·Granted Sep 2, 2014·4 cites·14 claims
- 0235US8848469B2Semiconductor device and testing method thereofKIM BO-YEUN·Filed 2011·Granted Sep 30, 2014·0 cites·20 claims
- 0335US8149636B2Semiconductor memory device with pulse width determinationKIM BO-YEUN·Filed 2008·Granted Apr 3, 2012·0 cites·17 claims
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