Assignee
KIMURA KENJIRO
JP·3 granted patents·1 pending application·22 citations·filing 2008–2014
Top patents by PatentIndex Score
4 records- 0183US8536862B2Apparatus and method of obtaining field by measurementKIMURA KENJIRO·Filed 2008·Granted Sep 17, 2013·17 cites·18 claims
- 0275US9568567B2Distribution analysis deviceKIMURA KENJIRO·Filed 2012·Granted Feb 14, 2017·4 cites·8 claims
- 0358US10295617B2Distribution analyzing device and distribution analyzing methodKIMURA KENJIRO·Filed 2014·Granted May 21, 2019·1 cites·11 claims
- 0439US2012330581A1Potential obtaining apparatus, magnetic field microscope, inspection apparatus, and potential obtaining methodKIMURA KENJIRO·Filed 2011·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →