Assignee
KITAYAMA SHINYA
JP·3 granted patents·12 citations·filing 2011–2012
Technology mixH01J3
Top patents by PatentIndex Score
3 records- 0187US9202672B2Apparatus and method for probe shape processing by ion beamKITAYAMA SHINYA·Filed 2011·Granted Dec 1, 2015·12 cites·12 claims
- 0244US9111721B2Ion beam device and machining methodKITAYAMA SHINYA·Filed 2012·Granted Aug 18, 2015·0 cites·10 claims
- 0343US8791413B2Charged particle beam device and sample observation method using a rotating detectorKITAYAMA SHINYA·Filed 2011·Granted Jul 29, 2014·0 cites·9 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →