Assignee
KIYOKAWA TOSHIYUKI
JP·4 granted patents·53 citations·filing 2009–2010
Top patents by PatentIndex Score
4 records- 0192US8513962B2Wafer tray and test apparatusKIYOKAWA TOSHIYUKI·Filed 2010·Granted Aug 20, 2013·16 cites·13 claims
- 0291US8493083B2Test apparatus, test method and computer readable mediumKIYOKAWA TOSHIYUKI·Filed 2010·Granted Jul 23, 2013·11 cites·8 claims
- 0388US8299935B2Test apparatus and test methodKIYOKAWA TOSHIYUKI·Filed 2010·Granted Oct 30, 2012·23 cites·20 claims
- 0470US9121901B2Semiconductor wafer test apparatusKIYOKAWA TOSHIYUKI·Filed 2009·Granted Sep 1, 2015·3 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when KIYOKAWA TOSHIYUKI files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →