Assignee
KIYOTA MFG CO
JP·2 granted patents·12 citations·filing 2005–2006
Top patents by PatentIndex Score
2 records- 0173US7208966B2Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probeKIYOTA MFG CO·Filed 2005·Granted Apr 24, 2007·7 cites·7 claims
- 0267US7227352B2Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probeKIYOTA MFG CO·Filed 2006·Granted Jun 5, 2007·5 cites·2 claims
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