Assignee
KLA TENCOR TECH CORPORATION
US·3 granted patents·2 citations·filing 2015–2019
Top patents by PatentIndex Score
3 records- 0175US10713771B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2018·Granted Jul 14, 2020·1 cites·29 claims
- 0273US11204330B1Systems and methods for inspection of a specimenKLA TENCOR TECH CORPORATION·Filed 2015·Granted Dec 21, 2021·1 cites·86 claims
- 0365US11348222B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2019·Granted May 31, 2022·0 cites·30 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →