Assignee
KOBELCO RES INSTITUTE INC
JP·12 granted patents·7 pending applications·15 citations·filing 2013–2025
Top patents by PatentIndex Score
19 records- 0182US10090136B2Oxide sintered body and sputtering target, and method for producing sameKOBELCO RES INSTITUTE INC·Filed 2013·Granted Oct 2, 2018·6 cites·14 claims
- 0277US9905403B2Oxide sintered body and sputtering targetKOBELCO RES INSTITUTE INC·Filed 2013·Granted Feb 27, 2018·4 cites·10 claims
- 0372US2026098721A1Contour shape measurement device and method for the sameKOBELCO RES INSTITUTE INC·Filed 2025·Application pending·0 cites
- 0471US10030302B2Sintered body comprising LiCoO2, sputtering target, and production method for sintered body comprising LiCoO2KOBELCO RES INSTITUTE INC·Filed 2014·Granted Jul 24, 2018·2 cites·6 claims
- 0569US2026022928A1Surface height distribution measuring deviceKOBELCO RES INSTITUTE INC·Filed 2025·Application pending·0 cites
- 0667US10515787B2Oxide sintered body and sputtering target, and method for producing sameKOBELCO RES INSTITUTE INC·Filed 2014·Granted Dec 24, 2019·2 cites·19 claims
- 0766US9870902B2Li-containing oxide target assemblyKOBELCO RES INSTITUTE INC·Filed 2014·Granted Jan 16, 2018·1 cites·17 claims
- 0859US12437953B2Cathode member for electron beam generation, and method for manufacturing the sameKOBELCO RES INSTITUTE INC·Filed 2020·Granted Oct 7, 2025·0 cites·12 claims
- 0956US11091832B2Oxide sintered body and sputtering targetKOBELCO RES INSTITUTE INC·Filed 2018·Granted Aug 17, 2021·0 cites·6 claims
- 1055US11104615B2Oxide sintered body and sputtering targetKOBELCO RES INSTITUTE INC·Filed 2018·Granted Aug 31, 2021·0 cites·6 claims
- 1146US12540813B2Wafer thickness measurement device and method for sameKOBELCO RES INSTITUTE INC·Filed 2022·Granted Feb 3, 2026·0 cites·5 claims
- 1245US9892891B2Li-containing phosphoric-acid compound sintered body and sputtering target, and method for manufacturing said Li-containing phosphoric-acid compound sintered bodyKOBELCO RES INSTITUTE INC·Filed 2013·Granted Feb 13, 2018·0 cites·11 claims
- 1343US2018238818A1Inspection apparatus, inspection system and inspection methodKOBELCO RES INSTITUTE INC·Filed 2018·Application pending·0 cites
- 1439US2018297859A1LiCoO2-CONTAINING SINTERED COMPACT, LiCoO2-CONTAINING SPUTTERING TARGET, AND LiCoO2-CONTAINING SINTERED COMPACT MANUFACTURING METHODKOBELCO RES INSTITUTE INC·Filed 2016·Application pending·0 cites
- 1539US2019177230A1Oxide sintered body and sputtering target, and methods for manufacturing sameKOBELCO RES INSTITUTE INC·Filed 2017·Application pending·0 cites
- 1636US10663288B2Shape measuring apparatus and shape measuring method using matched frequency measuring lightKOBELCO RES INSTITUTE INC·Filed 2019·Granted May 26, 2020·0 cites·5 claims
- 1736US2020181762A1Aluminum alloy sputtering targetKOBELCO RES INSTITUTE INC·Filed 2017·Application pending·0 cites
- 1830US10371503B2Shape measurement method and shape measurement deviceKOBELCO RES INSTITUTE INC·Filed 2016·Granted Aug 6, 2019·0 cites·7 claims
- 1927US2018223416A1Aluminum sputtering targetKOBELCO RES INSTITUTE INC·Filed 2016·Application pending·0 cites
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