Assignee
KOH RISHO
JP·1 granted patent·1 pending application·3 citations·filing 2005–2012
Top patents by PatentIndex Score
2 records- 0169US8633726B2Semiconductor device evaluation apparatus and semiconductor device evaluation methodKOH RISHO·Filed 2012·Granted Jan 21, 2014·3 cites·25 claims
- 0232US2009014795A1Substrate for field effect transistor, field effect transistor and method for production thereofKOH RISHO·Filed 2005·Application pending·0 cites
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