Assignee
KOMATSU SHIGEKAZU
JP·3 granted patents·1 pending application·9 citations·filing 2007–2010
Top patents by PatentIndex Score
4 records- 0164US8766658B2ProbeKOMATSU SHIGEKAZU·Filed 2009·Granted Jul 1, 2014·2 cites·11 claims
- 0263US8159245B2Holding member for inspection, inspection device and inspecting methodKOMATSU SHIGEKAZU·Filed 2007·Granted Apr 17, 2012·5 cites·10 claims
- 0361US8723544B2Structure of probe card for inspecting electrical characteristics of object to be inspectedKOMATSU SHIGEKAZU·Filed 2009·Granted May 13, 2014·2 cites·9 claims
- 0436US2012194213A1Probe cardKOMATSU SHIGEKAZU·Filed 2010·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →