Assignee
KOMOTO YOSHIO
JP6 patents
Top patents by PatentIndex Score
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Test wafer unit and test system
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Probe apparatus and test apparatus
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Probe wafer, probe device, and testing system
KOMOTO YOSHIO3 citations60
US8667669B2Mar 11, 2014
Apparatus and method for manufacturing a packaged device
KOMOTO YOSHIO0 citations49
US8652857B2Feb 18, 2014
Test apparatus, test method and manufacturing method for testing a device under test packaged in a test package
KOMOTO YOSHIO0 citations49
US8427187B2Apr 23, 2013
Probe wafer, probe device, and testing system
KOMOTO YOSHIO1 citations49