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US9 patents
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US8161347B1Apr 17, 2012
Interleaving parity bits into user bits to guarantee run-length constraint
KOU YU16 citations92
US8898546B1Nov 25, 2014
Error recovery using erasures for NAND flash
KOU YU5 citations84
US8589760B1Nov 19, 2013
Defect scan and manufacture test
KOU YU7 citations84
US8819524B2Aug 26, 2014
Manufacturing testing for LDPC codes
KOU YU3 citations62
US8281224B1Oct 2, 2012
Programmable LBA and dummy bit reliabilities
KOU YU4 citations62
US8266497B1Sep 11, 2012
Manufacturing testing for LDPC codes
KOU YU4 citations62
US8914709B1Dec 16, 2014
Manufacturing testing for LDPC codes
KOU YU0 citations52
US8607132B1Dec 10, 2013
Matching signal dynamic range for turbo equalization system
KOU YU1 citations52
US8321750B2Nov 27, 2012
Interleaving parity bits into user bits to guarantee run-length constraint
KOU YU1 citations52