Assignee
KOYAMA TAKAHIRO
JP·4 granted patents·1 pending application·11 citations·filing 2010–2025
Top patents by PatentIndex Score
5 records- 0185US12272081B2Inspection apparatus, image forming system, misalignment measurement method and storage mediumKOYAMA TAKAHIRO·Filed 2022·Granted Apr 8, 2025·1 cites·9 claims
- 0285US8648339B2Semiconductor device including first semiconductor chip including first pads connected to first terminals, and second semiconductor chip including second pads connected to second terminalsKOYAMA TAKAHIRO·Filed 2010·Granted Feb 11, 2014·8 cites·16 claims
- 0368US8987735B2Semiconductor deviceKOYAMA TAKAHIRO·Filed 2014·Granted Mar 24, 2015·2 cites·14 claims
- 0462US2025299006A1Image forming apparatus, image inspection method, and image inspection systemKOYAMA TAKAHIRO·Filed 2025·Application pending·0 cites
- 0553US11776111B2Information processing apparatus, control method for information processing apparatus, image forming system, and non-transitory computer-readable storage medium for detection of malfunction of conveying device that conveys medium to print engine of image forming apparatus and correction of amount of conveyance performed by the conveying device based on the detectionKOYAMA TAKAHIRO·Filed 2020·Granted Oct 3, 2023·0 cites·16 claims
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