Assignee
KRASSNITZER SIEGFRIED
AT·10 granted patents·1 pending application·16 citations·filing 2007–2012
Top patents by PatentIndex Score
11 records- 0190US9267200B2Method for supplying sequential power impulsesKRASSNITZER SIEGFRIED·Filed 2012·Granted Feb 23, 2016·9 cites·14 claims
- 0274US10253407B2Arc deposition source having a defined electric fieldKRASSNITZER SIEGFRIED·Filed 2011·Granted Apr 9, 2019·1 cites·10 claims
- 0365US11264216B2Modifiable magnet configuration for arc vaporization sourcesKRASSNITZER SIEGFRIED·Filed 2009·Granted Mar 1, 2022·1 cites·14 claims
- 0465US9376745B2High-power sputtering sourceKRASSNITZER SIEGFRIED·Filed 2012·Granted Jun 28, 2016·2 cites·8 claims
- 0565US9165749B2Arc source and magnet configurationKRASSNITZER SIEGFRIED·Filed 2007·Granted Oct 20, 2015·3 cites·10 claims
- 0649US8864959B2Method for manufacturing workpieces with ion-etched surfaceKRASSNITZER SIEGFRIED·Filed 2009·Granted Oct 21, 2014·0 cites·11 claims
- 0746US9657389B2Target for spark vaporization with physical limiting of the propagation of the sparkKRASSNITZER SIEGFRIED·Filed 2011·Granted May 23, 2017·0 cites·18 claims
- 0844US9226379B2Plasma sourceKRASSNITZER SIEGFRIED·Filed 2012·Granted Dec 29, 2015·0 cites·7 claims
- 0941US9208999B2Coil section assembly for simulating circular coils for vacuum devicesKRASSNITZER SIEGFRIED·Filed 2010·Granted Dec 8, 2015·0 cites·6 claims
- 1038US10418230B2Method and apparatus for manufacturing cleaned substrates or clean substrates which are further processedKRASSNITZER SIEGFRIED·Filed 2007·Granted Sep 17, 2019·0 cites·18 claims
- 1136US2014369387A1Method for the temperature measurement of substrates in a vacuum chamberKRASSNITZER SIEGFRIED·Filed 2012·Application pending·0 cites
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