Assignee
KUKREJA HIMANSHU
IN·2 granted patents·1 pending application·2 citations·filing 2011–2011
Technology mixG01R3
Top patents by PatentIndex Score
3 records- 0160US8832510B2Circuit to reduce peak power during transition fault testing of integrated circuitKUKREJA HIMANSHU·Filed 2011·Granted Sep 9, 2014·2 cites·10 claims
- 0236US8504886B2Method for partitioning scan chainKUKREJA HIMANSHU·Filed 2011·Granted Aug 6, 2013·0 cites·5 claims
- 0331US2013117618A1Scan testing of integrated circuit with clock gating cellsKUKREJA HIMANSHU·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →