Assignee
KURITA KAZUNARI
JP·9 granted patents·1 pending application·120 citations·filing 2007–2012
Top patents by PatentIndex Score
10 records- 0197US8063466B2Semiconductor substrate for solid-state image sensing device as well as solid-state image sensing device and method for producing the sameKURITA KAZUNARI·Filed 2007·Granted Nov 22, 2011·96 cites·5 claims
- 0282US8263484B2High resistivity silicon wafer and method for manufacturing the sameKURITA KAZUNARI·Filed 2010·Granted Sep 11, 2012·6 cites·20 claims
- 0377US8309436B2Method of producing epitaxial substrate with gettering for solid-state imaging device, and method of producing solid-state imaging device using same substrateKURITA KAZUNARI·Filed 2010·Granted Nov 13, 2012·4 cites·8 claims
- 0476US8101508B2Silicon substrate and manufacturing method thereofKURITA KAZUNARI·Filed 2009·Granted Jan 24, 2012·6 cites·4 claims
- 0572US8492193B2Semiconductor substrate for solid-state imaging sensing device as well as solid-state image sensing device and method for producing the sameKURITA KAZUNARI·Filed 2011·Granted Jul 23, 2013·2 cites·1 claims
- 0667US8124501B2Method of producing semiconductor waferKURITA KAZUNARI·Filed 2009·Granted Feb 28, 2012·2 cites·7 claims
- 0766US9281197B2Epitaxial substrate for solid-state imaging device with gettering sink, semiconductor device, back illuminated solid-state imaging device and manufacturing method thereofKURITA KAZUNARI·Filed 2009·Granted Mar 8, 2016·2 cites·12 claims
- 0863US8864907B2Silicon substrate and manufacturing method of the sameKURITA KAZUNARI·Filed 2009·Granted Oct 21, 2014·2 cites·7 claims
- 0947US2012329204A1Wafer for backside illumination type solid imaging device, production method thereof and backside illumination solid imaging deviceKURITA KAZUNARI·Filed 2012·Application pending·0 cites
- 1040US8658516B2Method of producing silicon wafer, epitaxial wafer and solid state image sensor, and device for producing silicon waferKURITA KAZUNARI·Filed 2011·Granted Feb 25, 2014·0 cites·11 claims
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