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KUTHI ANDRAS
US
2 patents
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US8192576B2
Jun 5, 2012
Methods of and apparatus for measuring and controlling wafer potential in pulsed RF bias processing
KUTHI ANDRAS
2 citations
56
US8303763B2
Nov 6, 2012
Measuring and controlling wafer potential in pulsed RF bias processing
KUTHI ANDRAS
0 citations
45