Assignee

LAHIRI SUDEEP KUMAR

US·2 granted patents·25 citations·filing 2008–2012

Technology mixB24B2 H10P2 H01L1

Top patents by PatentIndex Score

2 records

0187US8106651B2Methods and apparatuses for determining thickness of a conductive layerLAHIRI SUDEEP KUMAR·Filed 2008·Granted Jan 31, 2012·25 cites·32 claims
0245US9007059B2Methods for monitoring thickness of a conductive layerLAHIRI SUDEEP KUMAR·Filed 2012·Granted Apr 14, 2015·0 cites·27 claims

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