Assignee
LASER METRIC SYSTEMS INC
US·3 granted patents·54 citations·filing 1985–1987
Top patents by PatentIndex Score
3 records- 0171US4775236ALaser based roundness and diameter gaging system and method of using sameLASER METRIC SYSTEMS INC·Filed 1987·Granted Oct 4, 1988·27 cites·13 claims
- 0252US4678337ALaser based gaging system and method of using sameLASER METRIC SYSTEMS INC·Filed 1985·Granted Jul 7, 1987·14 cites·25 claims
- 0351US4816744AMethod and device for measuring inside diameters using a laser interferometer and capacitance measurementsLASER METRIC SYSTEMS INC·Filed 1987·Granted Mar 28, 1989·13 cites·20 claims
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