Assignee
LECROY CORP
US123 patents
Top patents by PatentIndex Score
US7050918B2May 23, 2006
Digital group delay compensator
LECROY CORP74 citations97
US7019544B1Mar 28, 2006
Transmission line input structure test probe
LECROY CORP126 citations97
US6822463B1Nov 23, 2004
Active differential test probe with a transmission line input structure
LECROY CORP96 citations97
US7219037B2May 15, 2007
High bandwidth oscilloscope
LECROY CORP50 citations96
US7058548B2Jun 6, 2006
High bandwidth real-time oscilloscope
LECROY CORP45 citations96
US6701335B2Mar 2, 2004
Digital frequency response compensator and arbitrary response generator system
LECROY CORP40 citations96
US6138080AOct 24, 2000
Method and system for node side analysis of computer network link
LECROY CORP50 citations95
US7373281B2May 13, 2008
High bandwidth oscilloscope
LECROY CORP39 citations94
US7262614B1Aug 28, 2007
Planar on edge probing tip with flex
LECROY CORP29 citations93
US7221179B1May 22, 2007
Bendable conductive connector
LECROY CORP17 citations93
US6819279B2Nov 16, 2004
Method and apparatus for the recovery of signals acquired by an interleaved system of digitizers with mismatching frequency response characteristics
LECROY CORP41 citations93
US6809535B2Oct 26, 2004
Notched electrical test probe tip
LECROY CORP27 citations93
US6567030B1May 20, 2003
Sample synthesis for matching digitizers in interleaved systems
LECROY CORP34 citations93
US6542914B1Apr 1, 2003
Method and apparatus for increasing bandwidth in sampled systems
LECROY CORP35 citations93
US6462529B1Oct 8, 2002
Legs for trimming a tripod with an electrical test probe tip
LECROY CORP20 citations93
US6242899B1Jun 5, 2001
Waveform translator for DC to 75 GHz oscillography
LECROY CORP37 citations93
US7865319B1Jan 4, 2011
Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems
LECROY CORP32 citations92
US7653514B2Jan 26, 2010
High bandwidth oscilloscope for digitizing an analog signal having a bandwidth greater than the bandwidth of digitizing components of the oscilloscope
LECROY CORP22 citations92
US7519513B2Apr 14, 2009
High bandwidth real time oscilloscope
LECROY CORP29 citations92
US7386409B2Jun 10, 2008
Method and apparatus for artifact signal reduction in systems of mismatched interleaved digitizers
LECROY CORP28 citations92
US7222055B2May 22, 2007
High bandwidth real-time oscilloscope
LECROY CORP24 citations92
US7139684B2Nov 21, 2006
High bandwidth real time oscilloscope
LECROY CORP29 citations92
US6956362B1Oct 18, 2005
Modular active test probe and removable tip module therefor
LECROY CORP16 citations92
US6863576B2Mar 8, 2005
Electrical test probe flexible spring tip
LECROY CORP24 citations92
US6016464AJan 18, 2000
Method and system for characterizing terminations in a local area network
LECROY CORP26 citations92
US7304597B1Dec 4, 2007
Adaptive interpolation for use in reducing signal spurs
LECROY CORP25 citations91
US7180314B1Feb 20, 2007
Self-calibrating electrical test probe calibratable while connected to an electrical component under test
LECROY CORP23 citations91
US6437552B1Aug 20, 2002
Automatic probe identification system
LECROY CORP35 citations90
US6269317B1Jul 31, 2001
Self-calibration of an oscilloscope using a square-wave test signal
LECROY CORP69 citations90
US7659790B2Feb 9, 2010
High speed signal transmission line having reduced thickness regions
LECROY CORP20 citations89
US7403560B2Jul 22, 2008
Simultaneous physical and protocol layer analysis
LECROY CORP20 citations89
US6965383B2Nov 15, 2005
Scaling persistence data with interpolation
LECROY CORP20 citations89
US6791545B2Sep 14, 2004
Measurement icons for digital oscilloscopes
LECROY CORP21 citations89
US6650131B2Nov 18, 2003
Electrical test probe wedge tip
LECROY CORP18 citations89
US5703838ADec 30, 1997
Vernier delay line interpolator and coarse counter realignment
LECROY CORP28 citations89
US5293122AMar 8, 1994
Signal probe with remote control function
LECROY CORP30 citations88
USD556066SNov 27, 2007
Housing for oscilloscope
LECROY CORP33 citations87
US6137749AOct 24, 2000
Apparatus and method for measuring time intervals with very high resolution
LECROY CORP48 citations87
US5838754ANov 17, 1998
Vernier delay line interpolator and coarse counter realignment
LECROY CORP24 citations87
US6539318B2Mar 25, 2003
Streaming architecture for waveform processing
LECROY CORP19 citations86
US6112160AAug 29, 2000
Optical recording measurement package
LECROY CORP20 citations86
US5621408AApr 15, 1997
Delta sigma analog-to-digital converter with temporally interleaved architecture
LECROY CORP28 citations86
US4805197AFeb 14, 1989
Method and apparatus for recovering clock information from a received digital signal and for synchronizing that signal
LECROY CORP31 citations86
US7383547B1Jun 3, 2008
Apparatus and technique for device emulation
LECROY CORP27 citations85
US7899638B2Mar 1, 2011
Estimating bit error rate performance of signals
LECROY CORP11 citations84
US7711510B2May 4, 2010
Method of crossover region phase correction when summing signals in multiple frequency bands
LECROY CORP12 citations84
US7671613B1Mar 2, 2010
Probing blade conductive connector for use with an electrical test probe
LECROY CORP9 citations84
US7535394B2May 19, 2009
High speed arbitrary waveform generator
LECROY CORP19 citations84
US7140105B2Nov 28, 2006
Method of fabricating a notched electrical test probe tip
LECROY CORP11 citations84
US7009377B2Mar 7, 2006
Cartridge system for a probing head for an electrical test probe
LECROY CORP13 citations82
Showing the top 50 of 123 patents by PatentIndex Score.