Assignee
LECROY CORP
US·123 granted patents·18 pending applications·2,108 citations·filing 1985–2010
Top patents by PatentIndex Score
141 records- 0198US7019544B1Transmission line input structure test probeLECROY CORP·Filed 2004·Granted Mar 28, 2006·126 cites·44 claims
- 0297US6822463B1Active differential test probe with a transmission line input structureLECROY CORP·Filed 2002·Granted Nov 23, 2004·96 cites·26 claims
- 0396US7139684B2High bandwidth real time oscilloscopeLECROY CORP·Filed 2005·Granted Nov 21, 2006·29 cites·16 claims
- 0495US7865319B1Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systemsLECROY CORP·Filed 2007·Granted Jan 4, 2011·32 cites·18 claims
- 0595US7519513B2High bandwidth real time oscilloscopeLECROY CORP·Filed 2006·Granted Apr 14, 2009·29 cites·18 claims
- 0695US7222055B2High bandwidth real-time oscilloscopeLECROY CORP·Filed 2005·Granted May 22, 2007·24 cites·58 claims
- 0794US7262614B1Planar on edge probing tip with flexLECROY CORP·Filed 2006·Granted Aug 28, 2007·29 cites·18 claims
- 0894US7058548B2High bandwidth real-time oscilloscopeLECROY CORP·Filed 2003·Granted Jun 6, 2006·45 cites·28 claims
- 0994US7050918B2Digital group delay compensatorLECROY CORP·Filed 2003·Granted May 23, 2006·74 cites·12 claims
- 1093US7386409B2Method and apparatus for artifact signal reduction in systems of mismatched interleaved digitizersLECROY CORP·Filed 2005·Granted Jun 10, 2008·28 cites·19 claims
- 1193US7219037B2High bandwidth oscilloscopeLECROY CORP·Filed 2005·Granted May 15, 2007·50 cites·48 claims
- 1291US7535394B2High speed arbitrary waveform generatorLECROY CORP·Filed 2007·Granted May 19, 2009·19 cites·14 claims
- 1391US7373281B2High bandwidth oscilloscopeLECROY CORP·Filed 2007·Granted May 13, 2008·39 cites·48 claims
- 1491US7304597B1Adaptive interpolation for use in reducing signal spursLECROY CORP·Filed 2006·Granted Dec 4, 2007·25 cites·28 claims
- 1591US7180314B1Self-calibrating electrical test probe calibratable while connected to an electrical component under testLECROY CORP·Filed 2005·Granted Feb 20, 2007·23 cites·26 claims
- 1691US6701335B2Digital frequency response compensator and arbitrary response generator systemLECROY CORP·Filed 2002·Granted Mar 2, 2004·40 cites·32 claims
- 1789US7653514B2High bandwidth oscilloscope for digitizing an analog signal having a bandwidth greater than the bandwidth of digitizing components of the oscilloscopeLECROY CORP·Filed 2008·Granted Jan 26, 2010·22 cites·20 claims
- 1889US6819279B2Method and apparatus for the recovery of signals acquired by an interleaved system of digitizers with mismatching frequency response characteristicsLECROY CORP·Filed 2003·Granted Nov 16, 2004·41 cites·24 claims
- 1989US6542914B1Method and apparatus for increasing bandwidth in sampled systemsLECROY CORP·Filed 2000·Granted Apr 1, 2003·35 cites·18 claims
- 2088US7659790B2High speed signal transmission line having reduced thickness regionsLECROY CORP·Filed 2006·Granted Feb 9, 2010·20 cites·17 claims
- 2187US7957938B2Method and apparatus for a high bandwidth oscilloscope utilizing multiple channel digital bandwidth interleavingLECROY CORP·Filed 2008·Granted Jun 7, 2011·19 cites·16 claims
- 2287US6809535B2Notched electrical test probe tipLECROY CORP·Filed 2003·Granted Oct 26, 2004·27 cites·12 claims
- 2386US6567030B1Sample synthesis for matching digitizers in interleaved systemsLECROY CORP·Filed 2002·Granted May 20, 2003·34 cites·15 claims
- 2485US7516030B2Measuring components of jitterLECROY CORP·Filed 2006·Granted Apr 7, 2009·14 cites·40 claims
- 2585US6437552B1Automatic probe identification systemLECROY CORP·Filed 2000·Granted Aug 20, 2002·35 cites·20 claims
- 2684US7965764B2Simultaneous physical and protocol layer analysisLECROY CORP·Filed 2010·Granted Jun 21, 2011·5 cites·13 claims
- 2784US7711510B2Method of crossover region phase correction when summing signals in multiple frequency bandsLECROY CORP·Filed 2007·Granted May 4, 2010·12 cites·17 claims
- 2883US6269317B1Self-calibration of an oscilloscope using a square-wave test signalLECROY CORP·Filed 1998·Granted Jul 31, 2001·69 cites·14 claims
- 2983US6138080AMethod and system for node side analysis of computer network linkLECROY CORP·Filed 1999·Granted Oct 24, 2000·50 cites·17 claims
- 3082US7899638B2Estimating bit error rate performance of signalsLECROY CORP·Filed 2006·Granted Mar 1, 2011·11 cites·5 claims
- 3182US7671613B1Probing blade conductive connector for use with an electrical test probeLECROY CORP·Filed 2007·Granted Mar 2, 2010·9 cites·25 claims
- 3279US7492177B1Bendable conductive connectorLECROY CORP·Filed 2007·Granted Feb 17, 2009·7 cites·15 claims
- 3379USD556066SHousing for oscilloscopeLECROY CORP·Filed 2006·Granted Nov 27, 2007·33 cites·1 claims
- 3479US7221179B1Bendable conductive connectorLECROY CORP·Filed 2004·Granted May 22, 2007·17 cites·25 claims
- 3579US6539318B2Streaming architecture for waveform processingLECROY CORP·Filed 2001·Granted Mar 25, 2003·19 cites·17 claims
- 3678US7378832B2Probing high-frequency signalsLECROY CORP·Filed 2006·Granted May 27, 2008·10 cites·24 claims
- 3777US7403560B2Simultaneous physical and protocol layer analysisLECROY CORP·Filed 2004·Granted Jul 22, 2008·20 cites·44 claims
- 3877US6863576B2Electrical test probe flexible spring tipLECROY CORP·Filed 2001·Granted Mar 8, 2005·24 cites·37 claims
- 3977US6462529B1Legs for trimming a tripod with an electrical test probe tipLECROY CORP·Filed 2000·Granted Oct 8, 2002·20 cites·13 claims
- 4076US6956362B1Modular active test probe and removable tip module thereforLECROY CORP·Filed 2002·Granted Oct 18, 2005·16 cites·26 claims
- 4176US6791545B2Measurement icons for digital oscilloscopesLECROY CORP·Filed 2001·Granted Sep 14, 2004·21 cites·18 claims
- 4276US6650131B2Electrical test probe wedge tipLECROY CORP·Filed 2003·Granted Nov 18, 2003·18 cites·9 claims
- 4375US7321234B2Resistive test probe tips and applications thereforLECROY CORP·Filed 2007·Granted Jan 22, 2008·7 cites·18 claims
- 4475US6137749AApparatus and method for measuring time intervals with very high resolutionLECROY CORP·Filed 1997·Granted Oct 24, 2000·48 cites·48 claims
- 4575US6016464AMethod and system for characterizing terminations in a local area networkLECROY CORP·Filed 1997·Granted Jan 18, 2000·26 cites·14 claims
- 4674US7634693B2Method and apparatus for analyzing serial data streamsLECROY CORP·Filed 2008·Granted Dec 15, 2009·6 cites·10 claims
- 4774US6965383B2Scaling persistence data with interpolationLECROY CORP·Filed 2001·Granted Nov 15, 2005·20 cites·30 claims
- 4874US6242899B1Waveform translator for DC to 75 GHz oscillographyLECROY CORP·Filed 1998·Granted Jun 5, 2001·37 cites·14 claims
- 4973US7466247B1Fractional-decimation signal processingLECROY CORP·Filed 2007·Granted Dec 16, 2008·9 cites·20 claims
- 5073US7432698B1Modular active test probe and removable tip module thereforLECROY CORP·Filed 2005·Granted Oct 7, 2008·6 cites·8 claims
Showing the top 50 of 141 patent records by PatentIndex Score.
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