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LEE CHRIS

US3 patents

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US9601393B2Mar 21, 2017

Selecting one or more parameters for inspection of a wafer

LEE CHRIS17 citations82

US9179857B2Nov 10, 2015

Guidewire and connector therefor

LEE CHRIS7 citations80

US8458264B1Jun 4, 2013

Email proxy server with first respondent binding

LEE CHRIS14 citations76