Assignee
LEE HEON-HEE
KR·3 granted patents·1 pending application·16 citations·filing 2011–2013
Top patents by PatentIndex Score
4 records- 0190US8539293B2Integrated circuit for compression mode scan testLEE HEON-HEE·Filed 2011·Granted Sep 17, 2013·14 cites·20 claims
- 0260US8677166B2Semiconductor devices and systems-on-chip having the sameLEE HEON-HEE·Filed 2011·Granted Mar 18, 2014·2 cites·14 claims
- 0341US2013305078A1System on chip (soc), method of operating the soc, and system having the socLEE HEON-HEE·Filed 2013·Application pending·0 cites
- 0437US8779828B2Semiconductor deviceLEE HEON-HEE·Filed 2012·Granted Jul 15, 2014·0 cites·12 claims
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