Assignee
LEE SUN JUNG
KR·2 granted patents·1 pending application·2 citations·filing 2007–2008
Top patents by PatentIndex Score
3 records- 0162US8228069B2Test apparatus for determining if adjacent contacts are short-circuited and semiconductor integrated circuit devices that include such test apparatusLEE SUN-JUNG·Filed 2008·Granted Jul 24, 2012·2 cites·17 claims
- 0245US8217393B2Test device, SRAM test device, semiconductor integrated circuit device and methods of fabricating the sameLEE SUN-JUNG·Filed 2008·Granted Jul 10, 2012·0 cites·25 claims
- 0336US2008067612A1Semiconductor Device Including Nickel Alloy Silicide Layer Having Uniform Thickness and Method of Manufacturing the SameLEE SUN JUNG·Filed 2007·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →