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LEU IYUN
TW6 patents
Top patents by PatentIndex Score
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Intelligent defect diagnosis method
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Method for smart defect screen and sample
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Integrated interfacing system and method for intelligent defect yield solutions
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Method for building rule of thumb of defect classification, and methods for classifying defect and judging killer defect based on rule of thumb and critical area analysis
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Method for utilizing fabrication defect of an article
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Method for defect diagnosis and management
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