Assignee
LI YI-FANG
TW·2 granted patents·5 citations·filing 2009–2012
Top patents by PatentIndex Score
2 records- 0170US8600117B2Automatic measurement system and method for plant features, and recording medium thereofLI YI-FANG·Filed 2009·Granted Dec 3, 2013·5 cites·14 claims
- 0241US8884404B2Mechanism of patterning a semiconductor device and product resulting therefromLI YI-FANG·Filed 2012·Granted Nov 11, 2014·0 cites·20 claims
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