Assignee
LIAO CHIN-I
TW·12 granted patents·2 pending applications·93 citations·filing 1999–2012
Top patents by PatentIndex Score
14 records- 0193US8754448B2Semiconductor device having epitaxial layerLIAO CHIN-I·Filed 2011·Granted Jun 17, 2014·18 cites·9 claims
- 0292US8796695B2Multi-gate field-effect transistor and process thereofLIAO CHIN-I·Filed 2012·Granted Aug 5, 2014·18 cites·10 claims
- 0392US8647953B2Method for fabricating first and second epitaxial cap layersLIAO CHIN-I·Filed 2011·Granted Feb 11, 2014·17 cites·19 claims
- 0483US8674433B2Semiconductor processLIAO CHIN-I·Filed 2011·Granted Mar 18, 2014·8 cites·13 claims
- 0582USD421650SElectrical fanLIAO CHIN-I·Filed 1999·Granted Mar 14, 2000·24 cites·1 claims
- 0678US8440511B1Method for manufacturing multi-gate transistor deviceLIAO CHIN-I·Filed 2011·Granted May 14, 2013·5 cites·11 claims
- 0766US8664069B2Semiconductor structure and process thereofLIAO CHIN-I·Filed 2012·Granted Mar 4, 2014·1 cites·6 claims
- 0861US8519390B2Test pattern for measuring semiconductor alloys using X-ray DiffractionLIAO CHIN-I·Filed 2011·Granted Aug 27, 2013·1 cites·20 claims
- 0959US8716750B2Semiconductor device having epitaxial structuresLIAO CHIN-I·Filed 2011·Granted May 6, 2014·1 cites·19 claims
- 1050US8481391B2Process for manufacturing stress-providing structure and semiconductor device with such stress-providing structureLIAO CHIN-I·Filed 2011·Granted Jul 9, 2013·0 cites·11 claims
- 1147US8709910B2Semiconductor processLIAO CHIN-I·Filed 2012·Granted Apr 29, 2014·0 cites·18 claims
- 1246US2012080721A1Semiconductor structure and method for making the sameLIAO CHIN-I·Filed 2010·Application pending·0 cites
- 1345US8962433B2MOS transistor processLIAO CHIN-I·Filed 2012·Granted Feb 24, 2015·0 cites·9 claims
- 1436US2013069172A1Semiconductor device and method for fabricating the sameLIAO CHIN-I·Filed 2011·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →