Assignee
LIN XI-WEI
US·2 granted patents·24 citations·filing 2009–2010
Top patents by PatentIndex Score
2 records- 0187US8086990B2Method of correlating silicon stress to device instance parameters for circuit simulationLIN XI-WEI·Filed 2009·Granted Dec 27, 2011·16 cites·14 claims
- 0284US8504969B2Filler cells for design optimization in a place-and-route systemLIN XI-WEI·Filed 2010·Granted Aug 6, 2013·8 cites·12 claims
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