Assignee
LINDSEY SCOTT E
US·3 granted patents·67 citations·filing 2010–2012
Technology mixG01R3
Top patents by PatentIndex Score
3 records- 0197US8228085B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2010·Granted Jul 24, 2012·26 cites·22 claims
- 0296US9250291B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2012·Granted Feb 2, 2016·19 cites·22 claims
- 0396US8947116B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2011·Granted Feb 3, 2015·22 cites·12 claims
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