Assignee
LIPHARDT MARTIN M
US·19 granted patents·51 citations·filing 2006–2024
Top patents by PatentIndex Score
19 records- 0187US8436994B2Fast sample height, AOI and POI alignment in mapping ellipsometer or the likeLIPHARDT MARTIN M·Filed 2011·Granted May 7, 2013·7 cites·7 claims
- 0286US8339603B1Mapping ellipsometers and polarimeters comprising polarization state compensating beam directing means, and method of useLIPHARDT MARTIN M·Filed 2009·Granted Dec 25, 2012·10 cites·17 claims
- 0383US8339602B1View-finder in ellipsometer or the like systemsLIPHARDT MARTIN M·Filed 2009·Granted Dec 25, 2012·8 cites·16 claims
- 0482US10247611B1Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prismsLIPHARDT MARTIN M·Filed 2015·Granted Apr 2, 2019·3 cites·30 claims
- 0582US8953030B1System for viewing samples that are undergoing ellipsometric investigation in real timeLIPHARDT MARTIN M·Filed 2012·Granted Feb 10, 2015·4 cites·4 claims
- 0682US8248606B1Sample mapping in environmental chamberLIPHARDT MARTIN M·Filed 2009·Granted Aug 21, 2012·7 cites·11 claims
- 0773US8749782B1DLP base small spot investigation systemLIPHARDT MARTIN M·Filed 2011·Granted Jun 10, 2014·3 cites·15 claims
- 0871US12498317B1Sample alignment system in reflectometers, ellipsometers, spectrophotometers and the likeLIPHARDT MARTIN M·Filed 2024·Granted Dec 16, 2025·0 cites·12 claims
- 0968US8983787B1Method of evaluating data qualityLIPHARDT MARTIN M·Filed 2012·Granted Mar 17, 2015·1 cites·8 claims
- 1068US8638437B2System and method of aligning a sampleLIPHARDT MARTIN M·Filed 2011·Granted Jan 28, 2014·1 cites·14 claims
- 1168US8416410B1Conjugate ratio adjustable lens systemLIPHARDT MARTIN M·Filed 2010·Granted Apr 9, 2013·1 cites·20 claims
- 1267US8064055B2System and method of aligning a sampleLIPHARDT MARTIN M·Filed 2009·Granted Nov 22, 2011·5 cites·7 claims
- 1365US8600703B1Method of evaluating data qualityLIPHARDT MARTIN M·Filed 2009·Granted Dec 3, 2013·1 cites·12 claims
- 1453US8159672B1Sample investigating system and method of useLIPHARDT MARTIN M·Filed 2009·Granted Apr 17, 2012·0 cites·13 claims
- 1552US11885738B1Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meet the scheimpflug condition and overcomes keystone errorLIPHARDT MARTIN M·Filed 2020·Granted Jan 30, 2024·0 cites·15 claims
- 1645US8587781B2View-finder in ellipsometer or the like systemsLIPHARDT MARTIN M·Filed 2012·Granted Nov 19, 2013·0 cites·5 claims
- 1744US8189193B1System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systemsLIPHARDT MARTIN M·Filed 2009·Granted May 29, 2012·0 cites·5 claims
- 1843US7738105B1System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systemsLIPHARDT MARTIN M·Filed 2006·Granted Jun 15, 2010·0 cites·3 claims
- 1936US9658151B2System for viewing samples that are undergoing ellipsometric investigation in real timeLIPHARDT MARTIN M·Filed 2015·Granted May 23, 2017·0 cites·6 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →