Assignee
LIU SHI-HUEI
TW·2 granted patents·1 pending application·2 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0149US8331178B2Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory deviceLIU SHI-HUEI·Filed 2011·Granted Dec 11, 2012·2 cites·18 claims
- 0231US2012167019A1Mask revision recording circuit for a memory circuitLIU SHI-HUEI·Filed 2011·Application pending·0 cites
- 0330US8713386B2Device for increasing chip testing efficiency and method thereofLIU SHI-HUEI·Filed 2012·Granted Apr 29, 2014·0 cites·21 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →