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LOGIC VISION INC

US5 patents

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US6000051ADec 7, 1999

Method and apparatus for high-speed interconnect testing

LOGIC VISION INC140 citations97
US5923676AJul 13, 1999

Bist architecture for measurement of integrated circuit delays

LOGIC VISION INC146 citations97
US6536008B1Mar 18, 2003

Fault insertion method, boundary scan cells, and integrated circuit for use therewith

LOGIC VISION INC57 citations96
US5812469ASep 22, 1998

Method and apparatus for testing multi-port memory

LOGIC VISION INC48 citations96
US6046946AApr 4, 2000

Method and apparatus for testing multi-port memory using shadow read

LOGIC VISION INC19 citations92