Assignee
LTX CORP
US36 patents
Top patents by PatentIndex Score
US6449741B1Sep 10, 2002
Single platform electronic tester
LTX CORP127 citations96
US5694063ADec 2, 1997
High speed IDDQ monitor circuit
LTX CORP115 citations94
US6625557B1Sep 23, 2003
Mixed signal device under test board interface
LTX CORP63 citations92
US6703825B1Mar 9, 2004
Separating device response signals from composite signals
LTX CORP19 citations91
US6563298B1May 13, 2003
Separating device response signals from composite signals
LTX CORP16 citations91
US6512989B1Jan 28, 2003
Generating and controlling analog and digital signals on a mixed signal test system
LTX CORP26 citations91
US6332212B1Dec 18, 2001
Capturing and displaying computer program execution timing
LTX CORP188 citations91
US5200696AApr 6, 1993
Test system apparatus with Schottky diodes with programmable voltages
LTX CORP57 citations91
US5191295AMar 2, 1993
Phase shift vernier for automatic test systems
LTX CORP45 citations91
US7191368B1Mar 13, 2007
Single platform electronic tester
LTX CORP28 citations90
US7092837B1Aug 15, 2006
Single platform electronic tester
LTX CORP28 citations90
US6675339B1Jan 6, 2004
Single platform electronic tester
LTX CORP36 citations90
US5694377ADec 2, 1997
Differential time interpolator
LTX CORP61 citations90
US5311486AMay 10, 1994
Timing generation in an automatic electrical test system
LTX CORP27 citations90
US6942019B2Sep 13, 2005
Apparatus and method for circuit board liquid cooling
LTX CORP46 citations89
US5552744ASep 3, 1996
High speed IDDQ monitor circuit
LTX CORP26 citations89
US7196566B2Mar 27, 2007
High-resolution variable attenuation device
LTX CORP28 citations87
US5717704AFeb 10, 1998
Test system including a local trigger signal generator for each of a plurality of test instruments
LTX CORP76 citations86
US6665185B1Dec 16, 2003
Apparatus and method for embedded fluid cooling in printed circuit boards
LTX CORP46 citations85
US6052810AApr 18, 2000
Differential driver circuit for use in automatic test equipment
LTX CORP23 citations85
US6700396B1Mar 2, 2004
Integrated micromachine relay for automated test equipment applications
LTX CORP14 citations83
US6418387B1Jul 9, 2002
Method of and system for generating a binary shmoo plot in N-dimensional space
LTX CORP16 citations82
US6211723B1Apr 3, 2001
Programmable load circuit for use in automatic test equipment
LTX CORP18 citations82
US6560756B1May 6, 2003
Method and apparatus for distributed test pattern decompression
LTX CORP17 citations79
US7231561B2Jun 12, 2007
Apparatus and method for data pattern alignment
LTX CORP10 citations75
US6903562B1Jun 7, 2005
Integrated micromachine relay for automated test equipment applications
LTX CORP5 citations73
US6489797B1Dec 3, 2002
Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics
LTX CORP12 citations68
US6323694B1Nov 27, 2001
Differential comparator with a programmable voltage offset for use in an automatic tester
LTX CORP10 citations66
US7849374B1Dec 7, 2010
Testing a transceiver
LTX CORP4 citations58
US7664621B2Feb 16, 2010
System and method for mapping system transfer functions
LTX CORP4 citations54
US7035887B2Apr 25, 2006
Apparatus and method for data shifting
LTX CORP3 citations54
US6728651B1Apr 27, 2004
Methods and apparatuses for digitally tuning a phased-lock loop circuit
LTX CORP4 citations53
US7919968B2Apr 5, 2011
System and method for distortion analysis
LTX CORP1 citations45
US5964445AOct 12, 1999
Load counterbalancing system with a constant load displacement force
LTX CORP1 citations44
US7512857B1Mar 31, 2009
Pattern correction circuit
LTX CORP0 citations43
US6768960B2Jul 27, 2004
System for and method of performing device-oriented tests
LTX CORP0 citations27