Assignee
MAI ZHIHONG
SG·2 granted patents·2 citations·filing 2008–2010
Top patents by PatentIndex Score
2 records- 0160US8489945B2Method and system for introducing physical damage into an integrated circuit device for verifying testing program and its resultsMAI ZHIHONG·Filed 2010·Granted Jul 16, 2013·2 cites·20 claims
- 0241US8158513B2Integrated circuit system employing backside energy source for electrical contact formationMAI ZHIHONG·Filed 2008·Granted Apr 17, 2012·0 cites·20 claims
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