Assignee

MAKHRATCHEV KONSTANTIN

US·2 granted patents·49 citations·filing 2009–2013

Technology mixH10P2 B23K1 H01J1 H01L1 H01R1 Y10T1

Top patents by PatentIndex Score

2 records

0196US9299539B2Method and apparatus for measuring wafer bias potentialMAKHRATCHEV KONSTANTIN·Filed 2009·Granted Mar 29, 2016·44 cites·7 claims
0283US9281226B2Electrostatic chuck having reduced power lossMAKHRATCHEV KONSTANTIN·Filed 2013·Granted Mar 8, 2016·5 cites·16 claims

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