Assignee
MARKWORT LARS
DE·6 granted patents·15 citations·filing 2010–2012
Top patents by PatentIndex Score
6 records- 0185US8102521B2Optical inspection system and methodMARKWORT LARS·Filed 2010·Granted Jan 24, 2012·7 cites·14 claims
- 0285US8072591B2Optical inspection system and methodMARKWORT LARS·Filed 2010·Granted Dec 6, 2011·7 cites·14 claims
- 0359US8460946B2Methods of processing and inspecting semiconductor substratesMARKWORT LARS·Filed 2011·Granted Jun 11, 2013·1 cites·20 claims
- 0438US8501503B2Methods of inspecting and manufacturing semiconductor wafersMARKWORT LARS·Filed 2012·Granted Aug 6, 2013·0 cites·32 claims
- 0536US9182357B2Semiconductor wafer inspection system and methodMARKWORT LARS·Filed 2010·Granted Nov 10, 2015·0 cites·22 claims
- 0632US8778702B2Method of inspecting and processing semiconductor wafersMARKWORT LARS·Filed 2010·Granted Jul 15, 2014·0 cites·41 claims
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