Assignee
MATSUMIYA SADAYUKI
JP·15 granted patents·41 citations·filing 2010–2012
Top patents by PatentIndex Score
15 records- 0184US8650767B2Coordinates measuring head unit and coordinates measuring machineMATSUMIYA SADAYUKI·Filed 2011·Granted Feb 18, 2014·7 cites·18 claims
- 0275US8650939B2Surface texture measuring machine and a surface texture measuring methodMATSUMIYA SADAYUKI·Filed 2010·Granted Feb 18, 2014·5 cites·4 claims
- 0365US8553232B2Interference objective lens unit and light-interference measuring apparatus using thereofMATSUMIYA SADAYUKI·Filed 2011·Granted Oct 8, 2013·2 cites·8 claims
- 0460USD657654SKnob for a stand for measuring instrumentsMATSUMIYA SADAYUKI·Filed 2011·Granted Apr 17, 2012·11 cites·1 claims
- 0552US9103656B2Method for cleaning skid of surface roughness testerMATSUMIYA SADAYUKI·Filed 2011·Granted Aug 11, 2015·0 cites·2 claims
- 0646USD659575SMeasuring headMATSUMIYA SADAYUKI·Filed 2011·Granted May 15, 2012·5 cites·1 claims
- 0741US8316553B2Coordinate measuring machineMATSUMIYA SADAYUKI·Filed 2010·Granted Nov 27, 2012·0 cites·1 claims
- 0839USD686095SDigital display device for surface-roughness measuring instrumentsMATSUMIYA SADAYUKI·Filed 2012·Granted Jul 16, 2013·3 cites·1 claims
- 0935USD678787SSurface-roughness measuring probeMATSUMIYA SADAYUKI·Filed 2011·Granted Mar 26, 2013·2 cites·1 claims
- 1034USD659574SMeasuring headMATSUMIYA SADAYUKI·Filed 2011·Granted May 15, 2012·1 cites·1 claims
- 1133USD678090SStand for a micrometerMATSUMIYA SADAYUKI·Filed 2011·Granted Mar 19, 2013·1 cites·1 claims
- 1233USD678033SStand for a micrometerMATSUMIYA SADAYUKI·Filed 2011·Granted Mar 19, 2013·1 cites·1 claims
- 1333USD659572SMeasuring headMATSUMIYA SADAYUKI·Filed 2011·Granted May 15, 2012·1 cites·1 claims
- 1432USD686096SDigital display device for surface-roughness measuring instrumentsMATSUMIYA SADAYUKI·Filed 2012·Granted Jul 16, 2013·1 cites·1 claims
- 1530USD666513SRemote probe for a coordinate measuring machineMATSUMIYA SADAYUKI·Filed 2011·Granted Sep 4, 2012·1 cites·1 claims
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