Assignee
MATSUMURA SHIGERU
JP·1 granted patent·1 pending application·2 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0160US8922232B2Test-use individual substrate, probe, and semiconductor wafer testing apparatusMATSUMURA SHIGERU·Filed 2011·Granted Dec 30, 2014·2 cites·12 claims
- 0232US2013082727A1Wafer tray, semiconductor wafer test apparatus, and test method of semiconductor waferMATSUMURA SHIGERU·Filed 2010·Application pending·0 cites
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