Assignee
MATSUO TATSURU
JP·3 granted patents·2 pending applications·15 citations·filing 2010–2012
Top patents by PatentIndex Score
5 records- 0178US8743637B2Memory device including redundant memory cell blockMATSUO TATSURU·Filed 2012·Granted Jun 3, 2014·8 cites·8 claims
- 0265US8325548B2Semiconductor device and semiconductor device test method for identifying a defective portionMATSUO TATSURU·Filed 2010·Granted Dec 4, 2012·4 cites·12 claims
- 0361US8278990B2Electric fuse cutoff control circuit renewing cutoff information and semiconductor deviceMATSUO TATSURU·Filed 2010·Granted Oct 2, 2012·3 cites·20 claims
- 0436US2012239337A1Semiconductor integrated circuit, test method and information processing apparatusMATSUO TATSURU·Filed 2012·Application pending·0 cites
- 0531US2013051158A1Integrated circuit, testing apparatus for integrated circuit, and method of testing integrated circuitMATSUO TATSURU·Filed 2012·Application pending·0 cites
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