Assignee
MAZNEV ALEXEI
US·1 granted patent·2 pending applications·1 citations·filing 2003–2017
Top patents by PatentIndex Score
3 records- 0161US10241058B2Systems and methods for quality control of a periodic structureMAZNEV ALEXEI·Filed 2017·Granted Mar 26, 2019·1 cites·16 claims
- 0237US2008049214A1Measuring Diffractive Structures By Parameterizing Spectral FeaturesMAZNEV ALEXEI·Filed 2007·Application pending·0 cites
- 0329US2007024871A1Method and apparatus for measuring thickness of thin films via transient thermoreflectanceMAZNEV ALEXEI·Filed 2003·Application pending·0 cites
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