Assignee
METRIS N V
BE·4 granted patents·102 citations·filing 2003–2011
Top patents by PatentIndex Score
4 records- 0195US8353059B2Optical scanning probeMETRIS N V·Filed 2011·Granted Jan 8, 2013·31 cites·6 claims
- 0282US7299145B2Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probeMETRIS N V·Filed 2006·Granted Nov 20, 2007·16 cites·26 claims
- 0381US7009717B2Optical probe for scanning the features of an object and methods thereforMETRIS N V·Filed 2003·Granted Mar 7, 2006·34 cites·42 claims
- 0473US6944564B2Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probeMETRIS N V·Filed 2003·Granted Sep 13, 2005·21 cites·46 claims
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