Assignee
MICRONICS JAPAN CO LTD
JP·6 granted patents·24 citations·filing 2005–2011
Top patents by PatentIndex Score
6 records- 0185US7884630B2IC carrie, IC socket and method for testing IC deviceMICRONICS JAPAN CO LTD·Filed 2005·Granted Feb 8, 2011·15 cites·20 claims
- 0265US7659727B2Multilayer wiring board and method for testing the sameMICRONICS JAPAN CO LTD·Filed 2008·Granted Feb 9, 2010·3 cites·5 claims
- 0357US8365130B2Computer program and method for generating wire routing patternMICRONICS JAPAN CO LTD·Filed 2011·Granted Jan 29, 2013·2 cites·2 claims
- 0456US7800384B2Probe unit substrateMICRONICS JAPAN CO LTD·Filed 2009·Granted Sep 21, 2010·2 cites·5 claims
- 0555US7504843B2Probe unit substrateMICRONICS JAPAN CO LTD·Filed 2007·Granted Mar 17, 2009·2 cites·2 claims
- 0640US7656166B2Multilayer wiring board and method for testing the sameMICRONICS JAPAN CO LTD·Filed 2008·Granted Feb 2, 2010·0 cites·8 claims
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