Assignee
MINATO YOSHIHISA
JP·3 granted patents·13 citations·filing 2006–2012
Top patents by PatentIndex Score
3 records- 0174US9269134B2Inspection area setting method for image inspecting deviceMINATO YOSHIHISA·Filed 2012·Granted Feb 23, 2016·5 cites·18 claims
- 0270US9619877B2Image examination method and image examination apparatusMINATO YOSHIHISA·Filed 2012·Granted Apr 11, 2017·2 cites·11 claims
- 0363US9020209B2Face identification deviceMINATO YOSHIHISA·Filed 2006·Granted Apr 28, 2015·6 cites·16 claims
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