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MITRA AMBAR K

US2 patents

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US8617378B1Dec 31, 2013

Method for focused electric-field imprinting for micron and sub-micron patterns on wavy or planar surfaces

MITRA AMBAR K5 citations79

US8112384B2Feb 7, 2012

System and method for problem solving through dynamic/interactive concept-mapping

MITRA AMBAR K6 citations61