Assignee
MITSUBISHI DENKI KABSUHIKI KAI
US·5 granted patents·166 citations·filing 1995–1999
Top patents by PatentIndex Score
5 records- 0183US6646455B2Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matterMITSUBISHI DENKI KABSUHIKI KAI·Filed 1998·Granted Nov 11, 2003·52 cites·14 claims
- 0264US6292577B1Resemblance retrieval apparatus, and recording medium for recording resemblance retrieval programMITSUBISHI DENKI KABSUHIKI KAI·Filed 1998·Granted Sep 18, 2001·65 cites·5 claims
- 0352US6647066B1Method of determining a frequency offset between a set frequency and a desired frequency for synchronization with a multicarrier signalMITSUBISHI DENKI KABSUHIKI KAI·Filed 1999·Granted Nov 11, 2003·28 cites·10 claims
- 0451US5675696ADigital video signal recording and reproducing apparatusMITSUBISHI DENKI KABSUHIKI KAI·Filed 1995·Granted Oct 7, 1997·16 cites·45 claims
- 0534US5815029ASemiconductor circuit and semiconductor circuit deviceMITSUBISHI DENKI KABSUHIKI KAI·Filed 1997·Granted Sep 29, 1998·5 cites·10 claims
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