Assignee
MIZUNO MASAYUKI
JP·4 granted patents·10 citations·filing 2007–2009
Top patents by PatentIndex Score
4 records- 0174US8115507B2Circuit and method for parallel testing and semiconductor deviceMIZUNO MASAYUKI·Filed 2007·Granted Feb 14, 2012·9 cites·16 claims
- 0253US8178974B2Microstrip structure including a signal line with a plurality of slit holesMIZUNO MASAYUKI·Filed 2009·Granted May 15, 2012·0 cites·2 claims
- 0349US8093919B2Test circuit, method, and semiconductor deviceMIZUNO MASAYUKI·Filed 2007·Granted Jan 10, 2012·1 cites·6 claims
- 0443US8330483B2Semiconductor device to detect abnormal leakage current caused by a defectMIZUNO MASAYUKI·Filed 2007·Granted Dec 11, 2012·0 cites·14 claims
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