Assignee
MOCHII INC
US·13 granted patents·123 citations·filing 2012–2023
Top patents by PatentIndex Score
13 records- 0196US11404243B1MicroscopyMOCHII INC·Filed 2020·Granted Aug 2, 2022·6 cites·34 claims
- 0296US9564291B1Hybrid charged-particle beam and light beam microscopyMOCHII INC·Filed 2015·Granted Feb 7, 2017·41 cites·20 claims
- 0395US8748818B2Incoherent transmission electron microscopyMOCHII INC·Filed 2013·Granted Jun 10, 2014·31 cites·15 claims
- 0493US11398365B1Positioning samples for microscopy, inspection, or analysisMOCHII INC·Filed 2019·Granted Jul 26, 2022·9 cites·22 claims
- 0592US9997331B1Charged-particle beam microscopyMOCHII INC·Filed 2015·Granted Jun 12, 2018·14 cites·18 claims
- 0691US10847343B1MicroscopyMOCHII INC·Filed 2018·Granted Nov 24, 2020·6 cites·23 claims
- 0790US9899186B1Charged-particle beam microscope with an evaporatorMOCHII INC·Filed 2017·Granted Feb 20, 2018·6 cites·19 claims
- 0886US12094684B1Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopyMOCHII INC·Filed 2019·Granted Sep 17, 2024·4 cites·20 claims
- 0983US8569694B2Aberration-correcting dark-field electron microscopyMOCHII INC·Filed 2012·Granted Oct 29, 2013·5 cites·20 claims
- 1079US12397313B1Coating of samples for microscopyMOCHII INC·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 1177US8927932B2Scanning transmission electron microscopy for imaging extended areasMOCHII INC·Filed 2013·Granted Jan 6, 2015·1 cites·20 claims
- 1267US11850620B1Coating of samples for microscopyMOCHII INC·Filed 2019·Granted Dec 26, 2023·0 cites·18 claims
- 1365US12437965B1Charged-particle beam microscope with differential vacuum pressuresMOCHII INC·Filed 2023·Granted Oct 7, 2025·0 cites·19 claims
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